MTI Corporation - Cd Zn Te

MTI supplies high quality Cd

1-x

Zn

x

Te ( CZT) crystal at affordable cost. CZT crystal is grown by

special Bridgman technique up to 2" Diameter. Compared with CdTe, it has larger band gap and
excellent IR transmission. It is widely used as X-ray and

-ray detectors, and substrate for

epitaxial film. MTI provides two grades CZT crystal components, e.g substrate grade and
detector grade

Typical Properties of CZT Crystal

Substrate Grade

Detector grade

Chemical Formula

Cd

1-x

Zn

x

Te

Concentration

x=0.04

±

0.01

x=0.10

±

0.03

Crystal structure

Cubic, Zinc blend

Lattices constants

a=6.468

a=6.446 Å

Band gap

E

g

=1.63 (at 300K)

E

g

=1.658 (at 300K)

FWHM X-ray rocking curve < 50 rad·s
Infrared transmittance

> 60% (1.5~25

µ

m)

Resistance

> 10

3

cm >

10

9

cm

DEPD

< 1

×

10

5

/cm

2

Standard size

10x10x1.0 mm

up to 20x20x20 mm

MTI Corporation

2700D Rydin Road, Richmond, CA 94804, USA tel: 510-525-3070 fax: 510-525-4705

email: info@mticrystal.com website: www.mticrystal.com